Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...

Power-aware test is a major manufacturing consideration due to the problems of increased power dissipation in various test modes, as well as test implications that come up with the usage of various ...

Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...

Huge transistor counts, rising on-chip clock rates, relentlessly escalating levels of integration in systems-on-chip, and new types of defects seen in deep-submicron and nanometer processes are ...