Advances in deep learning have transformed the field of infrastructure maintenance, particularly in the automated detection and characterisation of defects in sewer pipelines. Leveraging large volumes ...

This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...

Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

At Productronica 2025, Controlar will showcase the CDIM — Curved Display Inspection Machine, a standalone, AI-powered vision ...

This article is part of our coverage of the latest in AI research. A new machine learning technique developed by researchers at Edge Impulse, a platform for creating ML models for the edge, makes it ...

UC San Francisco researchers have found a way to double doctors’ accuracy in detecting the vast majority of complex fetal heart defects in utero – when interventions could either correct them or ...