Samsung Electronics Co. Ltd. has successfully completed its evaluation of KLA-Tencor Corp.'s 2350 ultraviolet (UV) high-resolution imaging wafer inspection tool for use in monitoring the production of ...

Samsung Electronics Co. Ltd. has successfully completed its evaluation of KLA-Tencor Corp.'s 2350 ultraviolet (UV) high-resolution imaging wafer-inspection tool for use in monitoring the production of ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Unpatterned wafer inspection, which has flown well under the radar for most of the semiconductor industry, is becoming more critical amid the need to find defects earlier in the manufacturing process ...

As the automotive electronics market continues to grow, spurred by developments such as semi-autonomous and fully autonomous vehicles, the demand is increasing for power semiconductor components with ...