Power scarcity and security are creating uncertainty around operational continuity, safety and profitability, but where there ...

Just as I/O, controllers, HMIs, networks and servers are working towards interoperability, enterprise-level systems and ...

Abstract: The scan chain, a fundamental component of Design-for-Test (DfT) in modern integrated circuits (ICs), has long been exploited to inject malicious inputs and leak sensitive information.

Panchkula: Amid recent incidents of harassment involving students outside the NIFT campus in Sector 23, the state commission for women has directed the institute to install a complaint box for female ...

Abstract: Large language models (LLMs) for automatic code generation have recently achieved breakthroughs in several programming tasks. Their advances in competition-level programming problems have ...

LINCOLN, Neb. (KLKN) – Pickleball and crime may not be a common pairing, but that’s exactly what occurred at Roberts Park in Lincoln last Friday. A 500-pound storage box — used to hold extra ...