Abstract: In this paper, effects preceding a latch-up fault in insulated gate bipolar transistors (IGBTs) are studied. Primary failure modes associated with IGBT latch-up faults are reviewed.
Abstract: This paper proposes an integrated gate driver featuring soft turn-off and current limiting for a solid-state circuit breaker in primary shipboard DC systems. The added functionalities allow ...
You’re in, lights low, cup still warm. A soft click at the letterbox, a shadow moving past the glass, and your front door suddenly feels paper thin. That shiver has a name now: “homejacking” — when ...
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