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#PinPoint your Sample via AFM – discover the accurate nanomechanical imaging via PinPoint by Park Systems: https://okt.to/UR19ov PinPoint™ Nanomechanical Mode is designed to measure and map nanomechanical properties in materials and biological samples simultaneously, non-destructively, and in real-time from high-speed force-distance (F-d) curves with: ☑accurate control of both normal/contact force and time, per pixel, ☑ minimised lateral forces acting on the probe, ☑ perfect quantitative propert

Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the defect review process and increases production throughput by the astounding 1,000%. Discover unique application capabilities of the Wafer Series with automatic defect review (ADR), low noise atomic force profiler for accurate, high throughput CMP profile measurements and sub-angstrom surface roughness measured with extreme accuracy and minimized tip-to-tip variation. Learn more: https://p

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